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        E7515B UXM 5G Wireless Test Platform

        Keysight』s 5G Network Emulation Solutions enable the 5G device ecosystem to accelerate from development to deployment. The solutions span and connect the entire device workflow from R&D and design

        產品型號 : E7515B
        產品品牌 : Keysight

        Keysight』s 5G Network Emulation Solutions enable the 5G device ecosystem to accelerate from development to deployment. The solutions span and connect the entire device workflow from R&D and design validation, to conformance verification, carrier acceptance and manufacturing. The integrated software-centric approach, with a common scripting engine, 5G stack and advanced analysis tools allows users to eliminate disconnected workflows across the device ecosystem and between teams to achieve more cost-efficient test methods. Exploit a high level of flexibility and control to fast-track test case creation and gain deeper insights from your analysis processes.

        Keysight』s 5G Network Emulation Solutions are built on the E7515B UXM 5G Wireless Test Platform – a highly-integrated signaling test platform with multi-format stack support, rich processing power and abundant RF resources. Supporting the latest 3GPP Release 15 and beyond, the UXM 5G enables users to establish a 5G call with a device under test (DUT) in different 5G NR deployment modes (non-stand alone (NSA) and stand-alone (SA)) and frequency bands (FR1 and FR2) and perform signaling test in terms of device RF characteristics, protocol compliance and functional key performance indicators.

        The E7515B UXM 5G Wireless Test Platform is used in Keysight』s 5G Protocol R&D Toolset and 5G RF DVT Toolset that form part of Keysight』s suite of 5G Network Emulation Solutions.

        The highly-integrated design of the UXM 5G optimizes use of lab space and supports extended test coverage in a single unit, including the following capability:

        • 5G NR 8CC DL and 4 CC UL 2x2, with LTE 2CC

        • Wide bandwidth in each RF port

        • Multi Angle of Arrival test

        • Internal fading

        Frequency extensions to high IF and mmWave are supported with the use of a common interface unit and remote radio heads (RRH).

        Users can validate DUT performance Over-the-Air (OTA) with chambers designed for different test cases across the device workflow.


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